SN54ABT8996 Status: ACTIVE

10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1

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Datasheet

10-Bit Addressable Scan Ports Multi-Drop Addressable IEEE 1149.1 (Rev. C) (PDF 935 KB)
15 Apr 1999

	SN54ABT8996	SN74ABT8996
Voltage Nodes(V)	5	5
Vcc range(V)	4.5 to 5.5	4.5 to 5.5
Input Level	TTL	TTL
Output Level	TTL	TTL
Rating	Military	Catalog
Technology Family	JTAG	JTAG
	Samples	Samples
	Inventory	Inventory

Other qualified versions of SN54ABT8996

Version	Part Number	Definition
Catalog	SN74ABT8996	TI's standard catalog product

Customers Who Evaluated This Product Also Evaluated

TMS320F2806: 32-Bit Digital Signal Controller with Flash

Product Information

Features

Members of Texas Instruments Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture
Extend Scan Access From Board Level to Higher Levels of System Integration
Promote Reuse of Lower-Level (Chip/Board) Tests in System Environment
Switch-Based Architecture Allows Direct Connect of Primary TAP to Secondary TAP
Primary TAP Is Multidrop for Minimal Use of Backplane Wiring Channels
Simple Addressing (Shadow) Protocol Is Received/Acknowledged on Primary TAP
Shadow Protocols Can Occur in Any of Test-Logic-Reset, Run-Test/Idle, Pause-DR, and Pause-IR TAP States to Provide for Board-to-Board Test and Built-In Self-Test
10-Bit Address Space Provides for Up to 1021 User-Specified Board Addresses
Bypass (BYP\) Pin Forces Primary-to-Secondary Connection Without Use of Shadow Protocols
Connect (CON\) Pin Provides Indication of Primary-to-Secondary Connection
High-Drive Outputs (-32-mA I_OH, 64-mA I_OL) Support Backplane Interface at Primary and High Fanout at Secondary
Package Options Include Plastic Small- Outline (DW) and Thin Shrink Small- Outline (PW) Packages, Ceramic Chip Carriers (FK), and Ceramic DIPs (JT)

SCOPE is a trademark of Texas Instruments Incorporated.

Description

The 'ABT8996 10-bit addressable scan ports (ASP) are members of the Texas Instruments (TI^TM) SCOPE^TM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most SCOPE^TM devices, the ASP is not a boundary-scannable device, rather, it applies TI's addressable-shadow-port technology to the IEEE Standard 1149.1-1990 (JTAG) test access port (TAP) to extend scan access beyond the board level.

Conceptually, the ASP is a simple switch that can be used to directly connect a set of multidrop primary TAP signals to a set of secondary TAP signals - for example, to interface backplane TAP signals to a board-level TAP.

View All Description in Datasheet

Pricing / Packaging / CAD Design Tools / Samples

				Price	Packaging		CAD Design Tools	Samples
Device	Status	Temp (^oC)	DSCC #	Price \| Quantity	Package \| Pins	Package QTY \| Package Carrier	Footprints	Samples
5962-9681201Q3A	ACTIVE	-55 to 125		33.98 \| 1ku	LCCC (FK) \| 28	1 \| TUBE	Purchase Samples
5962-9681201QKA	ACTIVE	-55 to 125		44.17 \| 1ku	CFP (W) \| 24	1 \| TUBE		Purchase Samples
5962-9681201QLA	ACTIVE	-55 to 125		25.50 \| 1ku	CDIP (JT) \| 24	1 \| TUBE	Purchase Samples
SN54ABT8996W	OBSOLETE				CFP (W) \| 24			Not Available
SNJ54ABT8996FK	ACTIVE	-55 to 125	5962-9681201Q3A	33.98 \| 1ku	LCCC (FK) \| 28	1 \| TUBE	Contact TI Distributor or Sales Office
SNJ54ABT8996JT	ACTIVE	-55 to 125	5962-9681201QLA	25.50 \| 1ku	CDIP (JT) \| 24	1 \| TUBE	Contact TI Distributor or Sales Office
SNJ54ABT8996W	ACTIVE	-55 to 125	5962-9681201QKA	44.17 \| 1ku	CFP (W) \| 24	1 \| TUBE		Contact TI Distributor or Sales Office

* Suggested Resale Price per unit (USD) for BUDGETARY USE ONLY. For higher volume price quotes,prices in local currency or delivery quotes, please contact your local Texas Instruments Sales Office or Authorized Distributor.

Inventory

Reported Distributor Inventory as of 11:28 AM GMT, 22 Nov 2009
Region	Company	In Stock	Purchase
TI Lead Time*: 8 Weeks5962-9681201Q3A
None Reported View Distributors
TI Lead Time*: 8 Weeks5962-9681201QKA
None Reported View Distributors
TI Lead Time*: 8 Weeks5962-9681201QLA
None Reported View Distributors
TI Lead Time*: 8 WeeksSNJ54ABT8996FK
None Reported View Distributors
TI Lead Time*: 8 WeeksSNJ54ABT8996JT
None Reported View Distributors
TI Lead Time*: 8 WeeksSNJ54ABT8996W
None Reported View Distributors
View all Distributors

** Lead time information is not available at this time. However, our information is updated daily so please check back with us soon. Please contact your preferred TI Authorized Distributor for additional information.

Quality & Lead (Pb)-Free Data

	Product Content				DPPM / MTBF / FIT Rate
Device	Eco Plan*	Lead / Ball Finish	MSL Rating / Peak Reflow	Details	Details
5962-9681201Q3A	TBD	POST-PLATE	N/A for Pkg Type	View	View
5962-9681201QKA	TBD	A42	N/A for Pkg Type	View	View
5962-9681201QLA	TBD	A42	N/A for Pkg Type	View	View
SNJ54ABT8996FK	TBD	POST-PLATE	N/A for Pkg Type	View	View
SNJ54ABT8996JT	TBD	A42	N/A for Pkg Type	View	View
SNJ54ABT8996W	TBD	A42	N/A for Pkg Type	View	View

* The planned eco-friendly classification: Pb-Free (RoHS) or Pb-Free (RoHS Exempt) or Green (RoHS & no Sb/Br) - please click on the Product Content Details "View" link in the table above for the latest availability information and additional product content details.

If the information you are requesting is not available online at this time, contact one of our Product Information Centers regarding the availability of this information.

Technical Documents

Most useful technical documents for SN54ABT8996

Datasheet

10-Bit Addressable Scan Ports Multi-Drop Addressable IEEE 1149.1 (Rev. C) (PDF, 935 KB)
15 Apr 1999

Application Notes

Testability Primer (Rev. D) (PDF, 360 KB) 9024 views
11 Mar 2005
Testability Primer (Rev. C) (PDF, 592 KB) 9024 views
01 Oct 1996
Shelf-Life Evaluation of Lead-Free Component Finishes (HTM, 8 KB) 27231 views
24 May 2004 Read Abstract
Cascading Multiple Linking Addressable Scan Port Devices (HTM, 8 KB) 664 views
05 Nov 2002 Read Abstract
Understanding and Interpreting Standard-Logic Data Sheets (Rev. B) (HTM, 8 KB) 21673 views
28 May 2003 Read Abstract

View Application Notes for Boundary Scan (JTAG) Support Devices

User Guides

LOGIC Pocket Data Book (Rev. B) (PDF, 6001 KB) 47290 views
16 Jan 2007

More Literature

Logic Cross-Reference (Rev. A) (PDF, 2938 KB) 15408 views
07 Oct 2003

Tools & Software

Name	Part #	Company	Tool / Software Type
Boundary-Scan Logic Models	BSDL	Texas Instruments	Simulators
Scan Educator	SCAN_EDUCATOR	Texas Instruments	Simulators

Customers Who Evaluated This Product Also Evaluated...
Part #	Name	Product Family	Comments
TMS320F2806	32-Bit Digital Signal Controller with Flash	C2000™ 32-BIT MICROCONTROLLERS-28X FIXED-POINT SERIES	TI customers also evaluated this product.

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SN54ABT8996 Status: ACTIVE

10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1

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Quality & Lead (Pb)-Free Data

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Datasheet

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SN54ABT8996 Status: ACTIVE

10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1

Most Popular Links

Datasheet

Other qualified versions of SN54ABT8996

Customers Who Evaluated This Product Also Evaluated

Product Information

Features

Description

Pricing / Packaging / CAD Design Tools / Samples

Inventory

Quality & Lead (Pb)-Free Data

Technical Documents

Datasheet

Application Notes

User Guides

More Literature

Tools & Software

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Support and Community

Customer Tags

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