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SN74AHC123A-EP

ACTIVE

Enhanced Product Dual Retriggerable Monostable Multivibrator

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Data sheet

SN74AHC123A-EP

ACTIVE
Data sheet Order now

Product details

Number of channels 2 Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Technology family AHC Input type Schmitt-Trigger Output type Push-Pull Supply current (µA) 40 IOL (max) (mA) 8 IOH (max) (mA) -8 Features Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs, Retriggerable Operating temperature range (°C) -55 to 125 Rating HiRel Enhanced Product
Number of channels 2 Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Technology family AHC Input type Schmitt-Trigger Output type Push-Pull Supply current (µA) 40 IOL (max) (mA) 8 IOH (max) (mA) -8 Features Balanced outputs, High speed (tpd 10-50ns), Over-voltage tolerant inputs, Retriggerable Operating temperature range (°C) -55 to 125 Rating HiRel Enhanced Product
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Operating Range 2-V to 5.5-V VCC
  • Schmitt-Trigger Circuitry On A, B, and CLR Inputs for Slow Input Transition Rates
  • Edge Triggered From Active-High or Active-Low Gated Logic Inputs
  • Retriggerable for Long Output Pulses
  • Overriding Clear Terminates Output Pulse
  • Glitch-Free Power-Up Reset On Outputs
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Operating Range 2-V to 5.5-V VCC
  • Schmitt-Trigger Circuitry On A, B, and CLR Inputs for Slow Input Transition Rates
  • Edge Triggered From Active-High or Active-Low Gated Logic Inputs
  • Retriggerable for Long Output Pulses
  • Overriding Clear Terminates Output Pulse
  • Glitch-Free Power-Up Reset On Outputs
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AHC123A device is a dual retriggerable monostable multivibrator designed for 2-V to 5.5-V VCC operation.

This edge-triggered multivibrator features output pulse-duration control by three methods. In the first method, the A input is low, and the B input goes high. In the second method, the B input is high, and the A input goes low. In the third method, the A input is low, the B input is high, and the clear (CLR) input goes high.

The output pulse duration is programmed by selecting external resistance and capacitance values. The external timing capacitor must be connected between Cext and Rext/Cext (positive) and an external resistor connected between Rext/Cext and VCC. To obtain variable pulse durations, connect an external variable resistance between Rext/Cext and VCC. The output pulse duration can be reduced by taking CLR low.

Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. The A, B, and CLR inputs have Schmitt triggers with sufficient hysteresis to handle slow input transition rates with jitter-free triggering at the outputs.

Once triggered, the basic pulse duration can be extended by retriggering the gated low-level-active (A) or high-level-active (B) input. Pulse duration can be reduced by taking CLR low. CLR can be used to override A or B inputs. The input/output timing diagram illustrates pulse control by retriggering the inputs and early clearing.

The variance in output pulse duration from device to device is less than ±0.5% (typ) for given external timing components.

During power up, Q outputs are in the low state and Q outputs are in the high state. The outputs are glitch free, without applying a reset pulse.

For additional application information on multivibrators, see the application report Designing With the SN74AHC123A and SN74AHCT123A, literature number SCLA014.

The SN74AHC123A device is a dual retriggerable monostable multivibrator designed for 2-V to 5.5-V VCC operation.

This edge-triggered multivibrator features output pulse-duration control by three methods. In the first method, the A input is low, and the B input goes high. In the second method, the B input is high, and the A input goes low. In the third method, the A input is low, the B input is high, and the clear (CLR) input goes high.

The output pulse duration is programmed by selecting external resistance and capacitance values. The external timing capacitor must be connected between Cext and Rext/Cext (positive) and an external resistor connected between Rext/Cext and VCC. To obtain variable pulse durations, connect an external variable resistance between Rext/Cext and VCC. The output pulse duration can be reduced by taking CLR low.

Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. The A, B, and CLR inputs have Schmitt triggers with sufficient hysteresis to handle slow input transition rates with jitter-free triggering at the outputs.

Once triggered, the basic pulse duration can be extended by retriggering the gated low-level-active (A) or high-level-active (B) input. Pulse duration can be reduced by taking CLR low. CLR can be used to override A or B inputs. The input/output timing diagram illustrates pulse control by retriggering the inputs and early clearing.

The variance in output pulse duration from device to device is less than ±0.5% (typ) for given external timing components.

During power up, Q outputs are in the low state and Q outputs are in the high state. The outputs are glitch free, without applying a reset pulse.

For additional application information on multivibrators, see the application report Designing With the SN74AHC123A and SN74AHCT123A, literature number SCLA014.
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Technical documentation

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Type Title Date
* Data sheet SN74AHC123A-EP datasheet (Rev. A) 14 Mar 2007
* VID SN74AHC123A-EP VID V6206665 21 Jun 2016
* Radiation & reliability report SN74AHC123AMDREP Reliability Report 07 May 2012
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 26 Jul 2021
Application note Designing With the SN74LVC1G123 Monostable Multivibrator (Rev. A) PDF | HTML 13 Mar 2020
Selection guide Little Logic Guide 2018 (Rev. G) 06 Jul 2018
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note How to Select Little Logic (Rev. A) 26 Jul 2016
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dec 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Product overview Design Summary for WCSP Little Logic (Rev. B) 04 Nov 2004
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
Application note Selecting the Right Level Translation Solution (Rev. A) 22 Jun 2004
Application note Advanced High-Speed CMOS (AHC) Logic Family (Rev. C) 02 Dec 2002
Application note Texas Instruments Little Logic Application Report 01 Nov 2002
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 Aug 2002
Design guide AHC/AHCT Designer's Guide February 2000 (Rev. D) 24 Feb 2000
Application note Benefits & Issues of Migrating 5-V and 3.3-V Logic to Lower-Voltage Supplies (Rev. A) 08 Sep 1999
Product overview Military Advanced High-Speed CMOS Logic (AHC/AHCT) (Rev. C) 01 Apr 1998
Application note Migration From 3.3-V To 2.5-V Power Supplies For Logic Devices 01 Dec 1997
Application note Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 01 Aug 1997
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 01 Jun 1997
Application note Live Insertion 01 Oct 1996

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