Integrated ESD Clamps for D+, D–, VBUS, and ID Pins to Provide Single-Chip ESD Protection for USB High Speed, USB-OTG, and USB Charger Interface
Special Snap Back Technology Allows High-voltage Tolerance During Normal Operation while Reducing the Clamp Voltage during System Level ESD Stress
USB Signal Pins (D+, D–, ID)
0.8-pF Line Capacitance
Tolerates 6 V Signal
VBUS Line (VBUS)
11-pF Line Capacitance
Tolerates 20 V Signal
Flow-Through Pin Mapping for the High-Speed Lines Ensures Zero Additional Skew Due to Board Layout While Placing the ESD Protection Chip Near the Connector
Supports Data Rates in Excess of 480 Mbps
IEC 61000-4-2 (Level 4) System Level ESD Compliance Measured at the D+, D–, and ID Pins
±10-kV IEC 61000-4-2 Contact Discharge
±10-kV IEC 61000-4-2 Air-Gap Discharge
3 Amps Peak Pulse Current (8/20 µs Pulse) for VBUS and D+, D–, and ID Lines
The TPD4S012 is a four-channel electrostatic discharge (ESD) solution for USB charger or USB on-the-go (OTG) interface. In many cell phone applications, the USB connector is the de facto communication port for external communications like high-speed data transfer, audio signal, charging, car-kit, etc. In order to support different interfaces, the USB port needs to handle different voltage levels. For example, some chargers require the VBUS port of the USB connector to handle in excess of the normal VBUS voltage per USB specifications. The TPD4S012 offers combinations of two different clamp voltages to match the voltage tolerances of the different signal interfaces using the common USB connector. Refer to Figure 5-6 & Figure 9-12, special snap back technology allows high-voltage tolerance during normal operation while reducing the clamp voltage during system level ESD stress.
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Inventory
Reported Distributor Inventory as of 9:58 AM GMT, 09 Feb 2010
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