Logic in Live-Insertion Applications With a Focus on GTLP

Live-insertion capability is an essential part of today?s high-speed data systems because those systems are expected to run continuously without being powered down. This application report delves into the cause and prevention of live-insertion and nanosecond-discontinuity effects, using both simulation and actual test measurements from a specially built GTLP EVM. Hypothetical cases for precharge circuitry are also simulated for comparison of the impact of live-insertion events on different logic families. GTLP test results and simulation of the new VME technology show their robustness in dealing with live-insertion events.