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Product InformationFeatures
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated. Description
The 'LVT18512 and 'LVT182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment. In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. View All Description in Datasheet |
| Price | Packaging | CAD Design Tools | Samples | |||||
| Device | Status | Temp (oC) | Price | Quantity | Package | Pins | Top Side Marking | Package QTY | Package Carrier | Footprints | Samples |
| 74LVT18512DGGRE4 | ACTIVE | -40 to 85 | 6.60 | 1ku | TSSOP (DGG) | 64 | View | 2000 | LARGE T&R | Contact TI Distributor or Sales Office | |
| 74LVT18512DGGRG4 | ACTIVE | -40 to 85 | 6.60 | 1ku | TSSOP (DGG) | 64 | View | 2000 | LARGE T&R | Contact TI Distributor or Sales Office | |
| SN74LVT18512DGGR | ACTIVE | -40 to 85 | 6.60 | 1ku | TSSOP (DGG) | 64 | View | 2000 | LARGE T&R | Contact TI Distributor or Sales Office | |
* Suggested Resale Price per unit (USD) for BUDGETARY USE ONLY. For higher volume price quotes,prices in local currency or delivery quotes, please contact your local Texas Instruments Sales Office or Authorized Distributor.
| Reported Distributor Inventory as of 10:55 AM GMT, 26 Nov 2009 | |||
| Region | Company | In Stock | Purchase |
| TI Lead Time*: 20 Weeks74LVT18512DGGRE4 | |||
| Worldwide | DigiKey | Available | |
| TI Lead Time*: 20 Weeks74LVT18512DGGRG4 | |||
| Worldwide | DigiKey | Available | |
| TI Lead Time*: 20 WeeksSN74LVT18512DGGR | |||
| Americas | Avnet | >1k | |
| Rochester Electronics | >1k | ||
| Worldwide | DigiKey | >1k | |
** Lead time information is not available at this time. However, our information is updated daily so please check back with us soon. Please contact your preferred TI Authorized Distributor for additional information.
| Product Content | DPPM / MTBF / FIT Rate | ||||
| Device | Eco Plan* | Lead / Ball Finish | MSL Rating / Peak Reflow | Details | Details |
| 74LVT18512DGGRE4 | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | View | View |
| 74LVT18512DGGRG4 | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | View | View |
| SN74LVT18512DGGR | Green (RoHS & no Sb/Br) | CU NIPDAU | Level-1-260C-UNLIM | View | View |
* The planned eco-friendly classification: Pb-Free (RoHS) or Pb-Free (RoHS Exempt) or Green (RoHS & no Sb/Br) - please click on the Product Content Details "View" link in the table above for the latest availability information and additional product content details.
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Most useful technical documents for SN74LVT18512 
View Application Notes for Boundary Scan (JTAG) Bus Devices
| Name | Part # | Company | Tool / Software Type |
| Boundary-Scan Logic Models | BSDL | Texas Instruments | Simulators |
| Scan Educator | SCAN_EDUCATOR | Texas Instruments | Simulators |

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